1 A Brief History and State of the Art of Ellipsometry ......... 1
Eugene A. Irene
2 Advanced Mueller Ellipsometry Instrumentation and Data
Analysis .................................................... 31
Enric Garcia-Caurel, Razvigor Ossikovski, Martin Foldyna,
Angelo Pierangelo, Bernard Drévillon and Antonello De
Martino
3 Data Analysis for Nanomaterials: Effective Medium
Approximation, Its Limits and Implementations .............. 145
Josef Humlicek
4 Relationship Between Surface Morphology and Effective
Medium Roughness ........................................... 179
Angel Yanguas-Gil and Herbert Wormeester
5 Plasmonics and Effective-Medium Theory ..................... 203
David E. Aspnes
6 Thin Films of Nanostructured Noble Metals .................. 225
Herbert Wormeester and Thomas W.H. Oates
7 Spectroscopic Ellipsometry on Metallic Gratings ............ 257
Michael Bergmair, Kurt Hingerl and Peter Zeppenfeld
8 Ellipsometry at the Nanostructure .......................... 313
Yasuhiro Mizutani and Yukitoshi Otani
9 Spectroscopic Ellipsometry and Magneto-Optical Kerr
Spectroscopy of Magnetic Garnet Thin Films Incorporating
Plasmonic Nanoparticles .................................... 325
Satoshi Tomita
10 Generalized Ellipsometry Characterization of Sculptured
Thin Films Made by Glancing Angle Deposition ............... 341
Daniel Schmidt, Eva Schubert and Mathias Schubert
11 THz Generalized Ellipsometry Characterization of Highly-
Ordered Three-Dimensional Nanostructures ................... 411
Tino Hofmann, Daniel Schmidt and Mathias Schubert
12 Infrared Ellipsometric Investigations of Free Carriers
and Lattice Vibrations in Superconducting Cuprates ......... 429
Jiří Chaloupka, Dominik Munzar and Josef Humíiček
13 Real-Time Ellipsometry for Probing Charge-Transfer
Processes at the Nanoscale ................................. 453
Maria Losurdo, April S. Brown and Giovanni Bruno
14 Polarimetrie and Other Optical Probes for the Solid-
Liquid Interface ........................................... 493
Kurt Hingerl
15 Spectroscopic Ellipsometry for Functional Nano-Layers
of Flexible Organic Electronic Devices ..................... 529
Stergios Logothetidis and Argiris Laskarakis
16 Spectroscopic Ellipsometry of Nanoscale Materials
for Semiconductor Device Applications ...................... 557
Alain C. Diebold, Florence J. Nelson and Vimal K. Kamineni
17 Ellipsometry of Semiconductor Nanocrystals ................. 583
Peter Petrik and Miklos Fried
18 Spectroscopic Ellipsometry for Inline Process Control
in the Semiconductor Industry .............................. 607
Stefan Zollner
19 Thin Film Applications in Research and Industry
Characterized by Spectroscopic Ellipsometry ................ 629
Denis Cattelan, Celine Eypert, Marzouk Kloul, Mélanie
Gaillet, Jean-Paul Gaston, Roland Seitz, Assia Shagaleeva
and Michel Stchakovsky
20 Ellipsometry and Correlation Measurements .................. 669
Rados Gajic and Milka Jakovljevic
21 Nanotechnology: Applications and Markets, Present and
Future ..................................................... 705
Ottilia Saxl
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